“TECNALIA is developing a digital tool that replaces traditional I-V curve measurements”
TECNALIA is developing SOLARASP, a tool that provides a continuous, global and accurate overview of the performance of photovoltaic modules.
Inspection using I-V curves is currently the standard technique for assessing the performance and quality of photovoltaic modules. Although it provides valuable information, it has major constraints which affect its operational application.
It is a procedure that requires the intervention of engineers in the field, which means that energy production is interrupted during the inspection. Consequently, spot inspections are normally limited to once or twice a year on a limited section of the entire installation. Furthermore, qualified personnel are required to interpret the results correctly and draw conclusions that lead to adequate maintenance of the system.
TECNALIA is aware of these challenges and has developed SOLARASP, an innovative digital tool that replaces traditional I-V curve measurements with advanced analysis of plant operating data. This approach provides a continuous, comprehensive and accurate view of performance, eliminating disruption and significantly reducing the costs associated with traditional inspections.
SOLARASP offers multiple key benefits
- Real-time monitoring and no impact on production
- Comprehensive coverage of the entire photovoltaic plant
- Affordable and scalable to different installation sizes
- Incorporation of expert knowledge, which translates data into practical and directly actionable information
Thanks to these capabilities, the tool enables early fault detection, resulting in optimisation of operations and maintenance (O&M). This avoids unnecessary preventive interventions and improves the overall performance of the installation.
With SOLARASP, TECNALIA is strengthening its commitment to a more reliable, competitive and sustainable photovoltaic industry, helping to accelerate the transition towards a greener and more accessible energy future for all.