Measurement of residual surface stress through X-ray diffraction on iron, aluminium, nickel and copper-based metal materials.

This service is performed with Xstress 3000 G2R portable equipment. The technique used is based on X-ray diffraction, using a chrome anode to assess the stress in crystalline iron, aluminium, nickel and copper-based metal materials.
It facilitates the quantitative value of the internal stress in a part or component inherent in its production process.
The measurements are taken in accordance with UNE-EN 15305 “Test Method for Residual Stress analysis by X-ray Diffraction” and with the requirements set out by TECNALIA as a recognised radioactive installation IRA/3025.
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